This combined technology positions the company at the forefront in Europe as a reference laboratory in MRO for the aerospace sector.
Canagrosa has taken a significant step by acquiring a Scanning Electron Microscope (SEM) equipped with an Energy Dispersive X-ray Spectroscopy (EDS) system. This combined technology will enhance the quality and precision of several key day-to-day applications.
On the one hand, it will drive the morphological analysis of any type of surface treatment coating. This analysis is applicable both in process certifications and/or tests of this type, as well as in anodic layer analysis.
On the other hand, it will improve the study of the chemical composition of particles, mainly for the analysis of metallic particles that are detected in different aircraft systems, such as chip detectors. This information is key, even critical, to ensure flight safety.
And it will also influence the strategic application, especially in the aviation sector. A large number of airlines make use of SEM-EDS microscopy because, with the right sample preparation methods and expert technical staff, it provides information on quality controls. In this way, Canagrosa will deepen the investigation and understanding of materials.
In short, scanning electron microscopy (SEM-EDS), together with IR-FTIR spectroscopy, contribute to position Canagrosa at the forefront of European technology as a reference laboratory in MRO for the aerospace sector, which, combined with the team's expertise and excellence in customer response, enhances the trust placed in the company by major airlines worldwide.
SEM-EDS Microscopy
SEM microscopy uses a beam of electrons as opposed to optical microscopy, which illuminates the material to be observed with a beam of light (photons). In this way, it makes it possible to observe any material, whether metallic or organic, which reacts to the "bombardment".
In addition, using the diffuse energy detector, X-ray microanalysis can be performed to determine the chemical composition of the material.
This advanced microscopy technology has a large depth of field and produces high-resolution images (approximately 20 nanometers), allowing a remarkable approach to the microscopic world.
SEM technology also has the advantage of being able to reach levels of detail up to X20,000 and obtaining compositions with a high level of detail and depth.
On the other hand, energy dispersive X-ray spectroscopy (EDS) measures the energy of the X-rays captured from the emission of the sample, which allows the elemental composition of the material to be obtained by means of specific software.
